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%0 Conference Paper %A C. Soens %A C. Crunelle %A P. Wambacq %A G. Vandersteen %A S. Donnay %A Y. Rolain %A M. Kuijk %A A. Barel %T Characterization of Substrate Noise Impact on RF CMOS Integrated Circuits in Lightly Doped Substrates %B Finds and Results from the Swedish Cyprus Expedition: A Gender Perspective at the Medelhavsmuseet %I IEEE, 345 E 47TH ST, NEW YORK %8 May. 2003 %P 6
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