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ETRO Publications

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Conference Publication

%0 Conference Paper

%A L. Sheng

%A C. De Tandt

%A W. Ranson

%A R. Vounckx

%T Reliability Characterization of Thermal Micro-structures Implemented on 0.8 µm CMOS Chips

%B International Reliability Physics Symposium. IRPS 2000

%I International Reliability Physics Symposium. IRPS 2000, Vol. 38, pp. 112-117, San Jose, USA

%8 2000

%P 1
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Current ETRO Authors

Prof. Dr. Roger Vounckx

+32 (0)02 629 102

rvounckx@etrovub.be

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