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Conference Publication

Reliability Characterization of Thermal Micro-structures Implemented on 0.8 µm CMOS Chips

Host Publication: International Reliability Physics Symposium. IRPS 2000

Authors: L. Sheng, C. De Tandt, W. Ranson and R. Vounckx

Publisher: International Reliability Physics Symposium. IRPS 2000, Vol. 38, pp. 112-117, San Jose, USA

Publication Year: 2000

Number of Pages: 1
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Prof. Dr. Roger Vounckx

+32 (0)02 629 102

rvounckx@etrovub.be

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