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%0 Conference Paper %A A. Grill %A E. Bury %A J. Michl %A S. Tyaginov %A D. Linten %A T. Grasser %A B. Parvais %A B. Kaczer %A M. Waltl %A I. Radu %T Reliability and Variability of Advanced CMOS Devices at Cryogenic Temperatures %B 2020 IEEE International Reliability Physics Symposium, IRPS 2020 %I Institute of Electrical and Electronics Engineers Inc %8 Apr. 2020 %P 6
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