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Journal Publication

%0 Journal Article

%A S. Kim

%A J. Kim

%A D. Jang

%A R. Ritzenthaler

%A B. Parvais

%A J. Mitard

%A H. Mertens

%A T. Chiarella

%A N. Horiguchi

%A J. Woo Lee

%T Comparison of temperature dependent carrier transport in FinFET and gate-all-around nanowire FET

%B Applied Sciences (Switzerland)

%V 10

%N 8

%8 Apr. 2020

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Current ETRO Authors

Mr. Bertrand Parvais

+32 (0)

bparvais@etrovub.be

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