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@InProceedings{Pub_10307, author = {B. Parvais, P. Van Marcke, H. Mertens, J. Mitard, D. Jang, G. Eneman, H. Arimura, O. Richard, E. Capogreco, H. Bender, R. Ritzenthaler, A. Hikavyy, R. Loo, H. Dekkers, F. Sebaai, A. Milenin, N. Horiguchi, A. Mocuta, D. Mocuta and N. Collaert}, title={An in-depth study of high-performing strained germanium nanowires pFETs}, booktitle = {38th IEEE Symposium on VLSI Technology, VLSI Technology 2018}, publisher = {Institute of Electrical and Electronics Engineers Inc}, month={Oct}, year={2018}, pages={2} }
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