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ETRO Publications

IEEE Style
Conference Publication

L. Sheng, C. De Tandt, W. Ranson and R. Vounckx, “Reliability Characterization of Thermal Micro-structures Implemented on 0.8 µm CMOS Chips,” in International Reliability Physics Symposium. IRPS 2000, International Reliability Physics Symposium. IRPS 2000, Vol. 38, pp. 112-117, San Jose, USA, 2000, pp. 1.
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Current ETRO Authors

Prof. Dr. Roger Vounckx

+32 (0)02 629 102

rvounckx@etrovub.be

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IRIS • LAMI • AVSP

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