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ETRO Publications

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Journal Publication

S. Kim, J. Kim, D. Jang, R. Ritzenthaler, B. Parvais, J. Mitard, H. Mertens, T. Chiarella, N. Horiguchi and J. Woo Lee, “Comparison of temperature dependent carrier transport in FinFET and gate-all-around nanowire FET,” Applied Sciences (Switzerland), vol. 10, no. 8, Apr. 2020.
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Current ETRO Authors

Mr. Bertrand Parvais

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bparvais@etrovub.be

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