|
|
@Article{Pub_7970, author = {C. Soens, G. Van Der Plas, P. Wambacq, S. Donnay, M. Kuijk and A. Barel}, title={Performance degradation of RF circuits due to impact of digital switching noise}, journal={IEEE JOURNAL OF SOLID-STATE CIRCUITS}, volume={40}, issue={7}, pages={1472-1481}, month={Jan}, year={2005} }
|
|
