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Performance degradation of RF circuits due to impact of digital switching noise This publication appears in: IEEE JOURNAL OF SOLID-STATE CIRCUITS Authors: C. Soens, G. Van Der Plas, P. Wambacq, S. Donnay, M. Kuijk and A. Barel Volume: 40 Issue: 7 Pages: 1472-1481 Publication Date: Jan. 2005
Abstract: The past years the market of wireless applications has grown enourmously, driven by the development of high performance, low cost CMOS technologies. This CM”OS evolution allows the integration of an increasing amount of digital and analog functions on a single die, enabling cost and power reduction. In many cases the coupling of digital switching noise via the common die to the analog circuits degrades the overall system performance, sometimes resulting in device failure. An overview of substrate noise coupling issues can be found in [1]. The goal of this Ph.D. research is to fully uncerstand the mechanisms behind the performance degradation of RF circuits due to impact of digital switching noise in order to control and solve the problem.
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