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Pattern Classification Based on a Piecewise Multi-Linear Model for the Class Probability Densities Host Publication: SSPR 2000, SPR 2000, Proc. Joint IAPR Intl. Workshops on Syntactical and Structural Pattern Recog- nition and Statistical Pattern Recognition Alicante, Spain August 30 - September 1, 2000 Authors: E. Nyssen, L. van Kempen and H. Sahli Publisher: The Joint IAPR Intl. Workshops on Syntactical and Structural Pattern Recognition (SSPR 2000) and Statistical Pattern Recognition (SPR 2000), pp. 501-510, Alicante, Spain Publication Year: 2000 Number of Pages: 10
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