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Book Publication

Defect-based compact modeling of random telegraph noise

Host Publication: Noise in Nanoscale Semiconductor Devices

Authors: P. Weckx, B. Kaczer, M. Simicic, B. Parvais and D. Linten

Publisher: Springer International Publishing AG

Publication Date: Apr. 2020

Number of Pages: 16

ISBN: 9783030374990
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Current ETRO Authors

Mr. Bertrand Parvais

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bparvais@etrovub.be

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