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Experimental Evaluation of Self-Heating and Analog/RF FOM in GAA-Nanowire FETs This publication appears in: IEEE Transactions on Electron Devices Authors: R. Singh, K. Aditya, A. Veloso, B. Parvais and A. Dixit Volume: 66 Issue: 8 Pages: 3279-3285 Publication Date: Aug. 2019
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