|
%0 Conference Paper %A V. Kilchytska %A B. Kazemi Esfeh %A C. Gimeno %A B. Parvais %A N. Planes %A M. Haond %A D. Flandre %T Comparative study of non-linearities in 28 nm node FDSOI and Bulk MOSFETs %B oint International EUROSOl Workshop and International Conference on Ultimate Integration on Silicon-ULIS, EUROSOI-ULIS 2017 %I Institute of Electrical and Electronics Engineers Inc %8 Jun. 2017 %P 4
|
