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%0 Conference Paper %A B. Kazemi Esfeh %A V. Kilchytska %A B. Parvais %A N. Planes %A M. Haond %A D. Flandre %T Back-gate bias effect on FDSOI MOSFET RF Figures of Merits and parasitic elements %B oint International EUROSOl Workshop and International Conference on Ultimate Integration on Silicon-ULIS, EUROSOI-ULIS 2017 %I Institute of Electrical and Electronics Engineers Inc %8 Jun. 2017 %P 3
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