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Journal Publication
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%0 Journal Article %A B. Kaczer %A J. Franco %A P. Weckx %A P. Roussel %A V. Putcha %A E. Bury %A M. Simicic %A A. Chasin %A D. Linten %A B. Parvais %A F. Catthoor %A G. Rzepa %A M. Waltl %A T. Grasser %T A brief overview of gate oxide defect properties and their relation to MOSFET instabilities and device and circuit time-dependent variability %B Microelectronics Reliability %V 81 %P 186-194 %8 Feb. 2018
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