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Conference Publication
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%0 Conference Paper %A B. Parvais %A P. Wambacq %A A. Mercha %A D. Verkest %A A. Thean %A M. Sawada %A K. Nomoto %A T. Oishi %A H. Ammo %T A digital intensive circuit for low-frequency noise monitoring in 28nm CMOS %B Solid-State Circuits Conference (A-SSCC), 2015 IEEE Asian %I IEEE %8 2015
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