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Journal Publication

%0 Journal Article

%A L. Sheng

%A C. De Tandt

%A W. Ranson

%A R. Vounckx

%T Reliability aspects of thermal micro-structures implemented on industrial 0.8 µm CMOS chips

%B Microelectronics Reliability

%V 41

%N 2

%P 307-315

%8 2001

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Current ETRO Authors

Prof. Dr. Roger Vounckx

+32 (0)02 629 102

rvounckx@etrovub.be

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