|
|
Journal Publication
|
|
|
|
|
|
%0 Journal Article %A K. Takakura %A V. Putcha %A E. Simoen %A A. R. Alian %A U. Peralagu %A N. Waldron %A B. Parvais %A N. Collaert %T Low-Frequency Noise Investigation of GaN/AlGaN MetalOxideSemiconductor High-Electron-Mobility Field-Effect Transistor With Different Gate Length and Orientation %B IEEE Transactions on Electron Devices %V 67 %N 8 %P 3062-3068 %8 Aug. 2020
|
|
|
|
|