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Journal Publication
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%0 Journal Article %A M. Simicic %A P. Weckx %A B. Parvais %A P. Roussel %A B. Kaczer %A G. Gielen %T Understanding the impact of time-dependent random variability on analog ICs: From single transistor measurements to circuit simulations %B IEEE Transactions on very large scale integration (VLSI) Systems %V 27 %N 3 %P 601-610 %8 Mar. 2019
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