|
|
|
|
Journal Publication
|
|
|
|
|
|
|
|
|
%0 Journal Article %A C. Gupta %A A. Gupta %A S. Tuli %A E. Bury %A B. Parvais %A A. Dixit %T Characterization and Modeling of Hot Carrier Degradation in N-Channel Gate-All-Around Nanowire FETs %B IEEE Transactions on Electron Devices %V 67 %N 1 %P 4-10 %8 Jan. 2020
|
|
|
|
|
|
