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@InProceedings{Pub_9768, author = {B. Kazemi Esfeh, V. Kilchytska, B. Parvais, N. Planes, M. Haond and D. Flandre}, title={Back-gate bias effect on FDSOI MOSFET RF Figures of Merits and parasitic elements}, booktitle = {oint International EUROSOl Workshop and International Conference on Ultimate Integration on Silicon-ULIS, EUROSOI-ULIS 2017}, publisher = {Institute of Electrical and Electronics Engineers Inc}, month={Jun}, year={2017}, pages={3} }
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