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@InProceedings{Pub_9767, author = {B. Kazemi Esfeh, V. Kilchytska, B. Parvais, N. Planes, M. Haond, D. Flandre and J. P. Raskin}, title={Back-gate bias effect on UTBB-FDSOI non-linearity performance}, booktitle = {European Solid-State Device Research Conference}, publisher = {Editions Frontieres, Neuily sur Seine, France}, month={Oct}, year={2017}, pages={4} }
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