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@Article{Pub_9766, author = {B. Kaczer, J. Franco, P. Weckx, P. Roussel, V. Putcha, E. Bury, M. Simicic, A. Chasin, D. Linten, B. Parvais, F. Catthoor, G. Rzepa, M. Waltl and T. Grasser}, title={A brief overview of gate oxide defect properties and their relation to MOSFET instabilities and device and circuit time-dependent variability}, journal={Microelectronics Reliability}, volume={81}, pages={186-194}, month={Feb}, year={2018} }
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