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@InProceedings{Pub_10535, author = {Y. Xiang, D. Yakimets, s. sant, E. Memisevic, m. garcia bardon, A. S. Verhulst, B. Parvais, A. Schenk, L. Erik Wernersson and G. Groeseneken}, title={Trap-aware compact modeling and power-performance assessment of III-V tunnel FET}, booktitle = {2018 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference, S3S 2018}, publisher = {Institute of Electrical and Electronics Engineers Inc}, month={Feb}, year={2019}, pages={3} }
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