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@InProceedings{Pub_10534, author = {Y. Xiang, A. Verhulst, B. Parvais, N. Horiguchi, G. Groeseneken, M. Garcia Bardon, M. Nur K. Alam, M. Thesberg, B. Kaczer, P. Roussel, M. I. Popovici and L. A. Ragnarsson}, title={Physical Insights on Steep Slope FEFETs including Nucleation-Propagation and Charge Trapping}, booktitle = {65th Annual IEEE International Electron Devices Meeting, IEDM 2019}, publisher = {Institute of Electrical and Electronics Engineers Inc}, month={Dec}, year={2019} }
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