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@InProceedings{Pub_10531, author = {V. Putcha, E. Bury, J. Franco, A. Walke, U. Peralagu, A. Alian, B. Kaczer, N. Waldron, D. Linten, B. Parvais and N. Collaert}, title={Exploring the DC reliability metrics for scaled GaN-on-Si devices targeted for RF/5G applications}, booktitle = {2020 IEEE International Reliability Physics Symposium, IRPS 2020}, publisher = {Institute of Electrical and Electronics Engineers Inc}, month={Apr}, year={2020} }
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