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@Article{Pub_10304, author = {Y. Xiang, A. S. Verhulst, D. Yakimets, B. Parvais, A. Mocuta and G. Groeseneken}, title={Process-Induced Power-Performance Variability in Sub-5-nm III–V Tunnel FETs}, journal={IEEE Transactions on Electron Devices}, volume={66}, issue={6}, pages={2802-2808}, month={Jun}, year={2019} }
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