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@Article{Pub_10301, author = {C. Gupta, A. Gupta, S. Tuli, E. Bury, B. Parvais and A. Dixit}, title={Characterization and Modeling of Hot Carrier Degradation in N-Channel Gate-All-Around Nanowire FETs}, journal={IEEE Transactions on Electron Devices}, volume={67}, issue={1}, pages={4-10}, month={Jan}, year={2020} }
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