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Conference Publication
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A. Pourkazemi and J. H. Stiens, “Localizing defect by means of Transient Radar Method(TRM) in 3D scanners 8th International Workshop on THz Technology and Applications,” in Transient Radar Method(TRM): Novel Illumination and Blind Electromagnetic/Geometrical Parameter Extraction Technique for Multilayer Structures, Mar. 2018.
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