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ETRO Publications

IEEE Style
Conference Publication

E. Cristofani, G. Pandey, N. Deligiannis and J. Stiens, “Compressed sensing and defect-based dictionaries for characteristics extraction in mm-wave non-destructive testing,” in International Conference on Infrared, Millimeter and Terahertz Wave, IEEE, 2016, pp. 2.
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Current ETRO Authors

Prof. Dr. Ir. Nikos Deligiannis

+32 (0)02 629 168

ndeligia@etrovub.be

more info

Prof. Dr. Ir. Johan Stiens

+32 (0)02 629 239

jstiens@etrovub.be

more info
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