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ETRO Publications

IEEE Style
Conference Publication

B. Cornelis, Y. Yang, J. Vogelstein, A. Dooms, I. Daubechies and D. Dunson, “Bayesian crack detection in ultra high resolution multimodal images of paintings,” in 18th International Conference on Digital Signal Processing (DSP 2013), IEEE, 2013, pp. 8.
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Current ETRO Authors

Dr. Ir. Bruno Cornelis

+32 (0)02 629 167

bcorneli@etrovub.be

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