|
|
V. Putcha, E. Bury, J. Franco, A. Walke, U. Peralagu, A. Alian, B. Kaczer, N. Waldron, D. Linten, B. Parvais and N. Collaert, “Exploring the DC reliability metrics for scaled GaN-on-Si devices targeted for RF/5G applications,” in 2020 IEEE International Reliability Physics Symposium, IRPS 2020, Institute of Electrical and Electronics Engineers Inc, Apr. 2020.
|
|
