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Journal Publication

@Article{Pub_10480,

author = {R. Yasser Gomaa Mohamed Elkashlan, R. Rodriguez, S. Yadav, A. Khaled, U. Peralagu, A. Alian, N. Waldron, M. Zhao, P. Wambacq, B. Parvais and N. Collaert},

title={Analysis of Gate-Metal Resistance in CMOS-Compatible RF GaN HEMTs},

journal={IEEE Transactions on Electron Devices},

volume={67},

issue={11},

pages={4592-4596},

month={Sep},

year={2020}

}

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+32 (0)16 281 218

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